Characteristic Auger electron emission as a tool for the analysis of surface composition
- 1 March 1969
- journal article
- Published by IOP Publishing in Physics Bulletin
- Vol. 20 (3) , 85-91
- https://doi.org/10.1088/0031-9112/20/3/002
Abstract
There has for some time been a pressing need to be able to analyse chemically material in the form of very thin layers at the surfaces of solids. By 'very thin' in this context is meant thicknesses in the range from a fraction of a monolayer to many monolayers or, approximately, from 5 to 100 Å.Keywords
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