Diffusion Length Measurement by Means of Ionizing Radiation
- 1 September 1962
- journal article
- website
- Published by Institute of Electrical and Electronics Engineers (IEEE) in Bell System Technical Journal
- Vol. 41 (5) , 1573-1588
- https://doi.org/10.1002/j.1538-7305.1962.tb03995.x
Abstract
Penetrating radiation in the form of high-energy electrons, heavy particles, and gamma rays may be used to determine minority-carrier diffusion lengths in semiconductor materials containing junctions by measuring the radiation-induced short circuit c...Keywords
This publication has 8 references indexed in Scilit:
- Silicon Solar Cells as Versatile Radiation DosimetersReview of Scientific Instruments, 1962
- Back-Scattering of Megavolt Electrons from Thick TargetsJournal of Applied Physics, 1962
- Range-Energy Relations for Protons in Be, C, Al, Cu, Pb, and AirPhysical Review B, 1959
- Irradiation of P-N Junctions with Gamma Rays: A Method for Measuring Diffusion LengthsProceedings of the IRE, 1958
- Recombination in SemiconductorsProceedings of the IRE, 1958
- Theory of Electron PenetrationPhysical Review B, 1955
- Passage of Heavy Particles through MatterReviews of Modern Physics, 1953
- Range-Energy Relations for Electrons and the Determination of Beta-Ray End-Point Energies by AbsorptionReviews of Modern Physics, 1952