Optical approach to thermopower and conductivity measurements in thin-film semiconductors
- 1 August 1984
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 45 (3) , 272-274
- https://doi.org/10.1063/1.95169
Abstract
An optical beam deflection technique is applied to measure the Joule and Peltier heat generated by electric currents through thin-film semiconductors. The method yields a spatially resolved conductivity profile and allows the determination of Peltier coefficients. Results obtained on doped hydrogenated amorphous silicon films are presented.Keywords
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