A semiconductor detector in a small angle X-ray diffraction study

• 1 July 1972
• journal article
• Published by IOP Publishing in Journal of Physics E: Scientific Instruments
• Vol. 5  (7) , 652-653
• https://doi.org/10.1088/0022-3735/5/7/017

Abstract

Keywords

• MEASUREMENT SYSTEM
• SEMICONDUCTOR DETECTOR
• SMALL ANGLE SCATTERING
• X RAY DIFFRACTION