A time-of-flight mass spectrometer for measurement of secondary ion mass spectra
- 1 October 1981
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 40 (2) , 185-193
- https://doi.org/10.1016/0020-7381(81)80041-1
Abstract
No abstract availableThis publication has 19 references indexed in Scilit:
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