Analysis of sedimentary organic materials by scanning electron microscopy: the application of backscattered electron imagery and light element X-ray microanalysis
- 31 July 1992
- journal article
- Published by Elsevier in Organic Geochemistry
- Vol. 18 (4) , 431-446
- https://doi.org/10.1016/0146-6380(92)90106-8
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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