Structural and electrical properties of bismuth telluride films grown by the molecular beam technique
- 1 June 1988
- journal article
- Published by Springer Nature in Journal of Materials Science Letters
- Vol. 7 (6) , 575-577
- https://doi.org/10.1007/bf01730298
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Sputtered Bi2Te3 and PbTe thin filmsJournal of Vacuum Science & Technology A, 1983
- Crystal growth and orientation in sputtered films of bismuth telluridePhilosophical Magazine, 1964
- The Electrical Conductivity and Thermoelectric Power of Bismuth TellurideProceedings of the Physical Society, 1958