HIVE: an efficient interconnect capacitance extractor to support submicron multilevel interconnect designs
- 10 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- VLSI wiring capacitanceIBM Journal of Research and Development, 1985
- Simple formulas for two- and three-dimensional capacitancesIEEE Transactions on Electron Devices, 1983