Placing the applications of high-resolution electron microscopy to chemical problems into wider perspective
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 8 (1-2) , 13-25
- https://doi.org/10.1016/0304-3991(82)90273-x
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Ordering of aluminium and silicon in synthetic faujasitesNature, 1981
- Single-crystal Raman spectroscopic study of apophyllite, a layer silicateInorganic Chemistry, 1981
- Solid-state 29Si n.m.r. and high-resolution electron microscopic studies of a silicate analogue of faujasiteJournal of the Chemical Society, Chemical Communications, 1981
- A reassessment of zeolite A: evidence that the structure is rhombohedral with unexpected ordering in the aluminosilicate frameworkJournal of the Chemical Society, Chemical Communications, 1981
- Structural studies of silicates by solid-state high-resolution silicon-29 NMRJournal of the American Chemical Society, 1980
- Direct imaging of a graphite intercalate: Evidence of interpenetration of ‘stages’ in graphite: Ferric chlorideMaterials Research Bulletin, 1980
- Lattice imaging of structural defects in a chain silicate: The pyroxenoid mineral rhodoniteMaterials Research Bulletin, 1980
- Direct imaging of atomsNature, 1979
- Guest species in minerals and other crystalsNature, 1979
- Vibrational spectra of synthetic single crystal tephroite, Mn2SiO4The Journal of Physical Chemistry, 1976