Discussion on “The Use of Hall Effect Semiconductors in Geotechnical Instrumentation” by C. R. I. Clayton, S. A. Khatrush, A. V. D. Bica, and A. Siddique
- 1 January 1990
- journal article
- Published by ASTM International in Geotechnical Testing Journal
- Vol. 13 (1) , 63
- https://doi.org/10.1520/gtj10149j
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