X-ray diffraction investigations of silica gel structures
- 1 April 1987
- journal article
- Published by Elsevier in Journal of Non-Crystalline Solids
- Vol. 91 (1) , 122-136
- https://doi.org/10.1016/s0022-3093(87)80089-3
Abstract
No abstract availableThis publication has 37 references indexed in Scilit:
- Structural evolution during the gel to glass conversionJournal of Non-Crystalline Solids, 1985
- X-ray diffraction investigations of differently prepared amorphous silicasPhysica Status Solidi (a), 1985
- Characterization of the SiO2-gel glass-forming process by high resolution 1H NMR in solidsColloids and Surfaces, 1984
- Fractal Geometry of Silica Condensation PolymersPhysical Review Letters, 1984
- Synthesis of glasses from gels: the problem of monolithic gelsJournal of Materials Science, 1982
- Untersuchung der Kondensationsreaktionen der Mono‐, Di‐ und Trikieselsäure mit der Trimethylsilylierungsmethode und 29Si‐NMR‐SpektroskopieZeitschrift für anorganische und allgemeine Chemie, 1979
- Analytic approximations for the incoherent X-ray and electron intensities of light atoms and ionsActa Crystallographica Section A, 1976
- On the determination of the absolute intensity of X-rays scattered by a non-crystalline specimenJournal of Applied Crystallography, 1972
- Revised parameters of the analytic fits for coherent and incoherent scattered X-ray intensities of the first 36 atomsActa Crystallographica Section A, 1972
- The structure of vitreous silicaJournal of Applied Crystallography, 1969