Measurement of Diffusion in Semiconductors by a Capacitance Method

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1 April 1952

journal article
research article
Published by American Physical Society (APS) in Physical Review B

Vol. 86 (1) , 137-138
https://doi.org/10.1103/PhysRev.86.137

Abstract

DOI:https://doi.org/10.1103/PhysRev.86.137

Keywords

This publication has 2 references indexed in Scilit:

Observations of Zener Current in Germanium $p - n$ Junctions
Physical Review B, 1951
Editorial Note Regarding Semiconductors
Bell System Technical Journal, 1949