Automatic testing of high resolution time digitizers

1 February 1988

journal article
Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science

Vol. 35 (1) , 187-190
https://doi.org/10.1109/23.12703

Abstract

An automated system for the testing and performance evaluation of high-resolution, long-range time digitizers is described. The test system uses an IBM PC/XT or PC/AT personal computer together with appropriate hardware interfacing modules to control the digitizer under test. Precise timing intervals for testing are generated by a pulse-calibration module driven by a programmable low-phase-noise frequency synthesizer. The time intervals measured by the digitizer are compared under computer control with the actual intervals produced by the synthesizer for a sufficient number of cases to establish the digitizer performance. The hardware and software components used are discussed.

Keywords

This publication has 3 references indexed in Scilit:

Multichannel Interval Timer
IEEE Transactions on Nuclear Science, 1984
252Cf-plasma desorption mass spectrometry multistop time digitizer
International Journal of Mass Spectrometry and Ion Physics, 1983
Space Borne Event Timer
IEEE Transactions on Nuclear Science, 1980