Size and Grain‐Boundary Effects in the Electrical Conductivity of Thin Monocrystalline Films
Open Access
- 1 January 1978
- journal article
- research article
- Published by Wiley in Active and Passive Electronic Components
- Vol. 5 (2) , 127-131
- https://doi.org/10.1155/apec.5.127
Abstract
By assuming that the scattering processes from other sources than grain‐boundaries can be described by a single relaxation time τ∗ and then by solving a Boltzmann equation in which grain‐boundary scattering is accounted for, we have obtained an analytical expression for the thin monocrystalline film conductivity in terms of the reduced thickness k and the grain‐boundary reflection coefficient r. Numerical tables are given to show the agreement of the above expression with the Mayadas‐Shatzkes expression.Keywords
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