The analysis of particle size distributions from field-ion microscope data
- 1 May 1969
- journal article
- research article
- Published by Taylor & Francis in Philosophical Magazine
- Vol. 19 (161) , 1061-1068
- https://doi.org/10.1080/14786436908225870
Abstract
This paper describes a method of obtaining second phase particle size distributions from field-ion data. The method relies on the image persistences of particles during field evaporation sequences. In order to reduce the amount of manipulation on the micrographs a statistical approach, which is independent of particle positions in the specimen, is adopted. This approach has distinct advantages over more direct methods and extensions of it could be applied to the analysis of data from other types of microscopy.Keywords
This publication has 5 references indexed in Scilit:
- Field-ion microscopy of an alloy steelPhilosophical Magazine, 1968
- The calculation of true particle size distributions from the sizes observed in a thin sliceBritish Journal of Applied Physics, 1967
- On field evaporationPhilosophical Magazine, 1966
- The interpretation of field-ion micrographs: The image from an order/disorder alloyPhilosophical Magazine, 1966
- The analysis of field evaporation data from field-ion microscope experimentsBritish Journal of Applied Physics, 1965