Spurious contributions from scattered electrons in thin-film X-ray microanalysis

• 1 June 1993
• journal article
• Published by Wiley in Journal of Microscopy
• Vol. 170  (3) , 259-264
• https://doi.org/10.1111/j.1365-2818.1993.tb03349.x

Abstract

Keywords

• STEM
• EDS
• X-RAY MICROANALYSIS
• SPURIOUS CONTRIBUTIONS
• SCATTERED ELECTRONS
• BREMSSTRAHLUNG
• HOLE COUNTS