On the surface roughness characterization for SAR data analysis

22 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

Vol. 2, 898-900
https://doi.org/10.1109/igarss.1997.615291

Abstract

The objective of this paper is to investigate the possibility of achieving a more realistic description of natural surfaces for microwave remote sensing purposes. By analyzing measured profiles, non-stationary effects which cannot be accounted for in the classical description of roughness are underlined. Subsequently, an expansion of 1/f processes in terms of wavelet orthonormal basis is used to derive a possible description of natural roughness.

Keywords

ROUGH SURFACES
SURFACE ROUGHNESS
DATA ANALYSIS
REMOTE SENSING
AUTOCORRELATION
EUROPE
TESTING
LAB-ON-A-CHIP
RANDOM PROCESSES
PARAMETER ESTIMATION

This publication has 2 references indexed in Scilit:

Wavelet-based representations for the 1/f family of fractal processes
Proceedings of the IEEE, 1993
Surface topography as a nonstationary random process
Nature, 1978