Infrared optical properties of silicon monoxide films
- 15 May 1980
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 19 (10) , 1694-1696
- https://doi.org/10.1364/ao.19.001694
Abstract
The dielectric function ε ≡ ε1 + iε2 of evaporated SiO films is reported for the wavelength region from 8 to 33 μm. The data are based on spectrophotometric measurements of reflectance and transmittance for films evaporated onto KRS-5 and crystalline Si and on reflectance measurements on films evaporated onto opaque Al layers. The consistency in the results for ε and ε2 is verified by the Kramers-Kronig analysis.Keywords
This publication has 24 references indexed in Scilit:
- Infrared reflectance of silicon oxide and magnesium fluoride protected aluminum mirrors at various angles of incidence from 8 μm to 12 μmApplied Optics, 1975
- The optical properties of evaporated silicon oxide filmsThin Solid Films, 1972
- Analysis of evaporated silicon oxide films by means of (d, p) nuclear reactions and infrared spectrophotometryPhysica Status Solidi (a), 1971
- Reflectance, Solar Absorptivity, and Thermal Emissivity of SiO_2-Coated AluminumApplied Optics, 1969
- Optical absorption in silicon monoxideJournal of Physics D: Applied Physics, 1968
- Spectre de transmission dans l'infrarouge (2 à 16 μ) pour divers oxydes de silicium en couche mince sur un substrat de siliciumRevue de Physique Appliquée, 1966
- Properties of Evaporated Thin Films of SiOJournal of the Electrochemical Society, 1963
- Infrared Properties of Silicon Monox and Evaporated SiO FilmsJournal of the American Ceramic Society, 1961
- Filmed Surfaces for Reflecting Optics*Journal of the Optical Society of America, 1955
- Optical Properties of Silicon Monoxide in the Wavelength Region from 024 to 140 Microns*Journal of the Optical Society of America, 1954