Structure and composition of grain boundary dislocation cores and stacking faults in MOCVD-grown YBa2Cu3O7−x thin films

This publication has 19 references indexed in Scilit:

• Superconducting transport properties of grain boundaries in ${\mathrm{YBa}}_2$${\mathrm{Cu}}_3$${\mathrm{O}}_7$ bicrystals
  Physical Review B, 1990
• Transport critical current and morphology for YBaCuO films prepared by chemical vapor deposition
  Physica C: Superconductivity and its Applications, 1989
• Orientation Dependence of Grain-Boundary Critical Currents inYBa2Cu3O7−δBicrystals
  Physical Review Letters, 1988
• Grain-boundary compositions in YBa2Cu3O7−x from Auger electron spectroscopy of fracture surfaces
  Journal of Applied Physics, 1988
• Direct measurement of the superconducting properties of single grain boundaries in ${\mathrm{Y}}_1$${\mathrm{Ba}}_2$${\mathrm{Cu}}_3$${\mathrm{O}}_{7\mathrm{-}\mathrm{\delta }}$
  Physical Review Letters, 1988
• Auger study of grain boundaries in large-grained YBa2Cu3Ox
  Applied Physics Letters, 1988
• Characterization of planar crystal lattice defects in the high-temperature superconductor YBa2Cu3O7
  Applied Physics Letters, 1988
• Surface decomposition of superconducting YBa2Cu3O7
  Physica Status Solidi (a), 1988
• Electron Diffraction and Electron Microscopy of the Superconducting Compound Ba2YCu3O7–δ
  Physica Status Solidi (a), 1987
• EMS - a software package for electron diffraction analysis and HREM image simulation in materials science
  Ultramicroscopy, 1987