Moiré Topography for the Measurement of Film Flatness
- 1 December 1970
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 9 (12) , 2802-2804
- https://doi.org/10.1364/ao.9.002802
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Interferometric generation of counter lines on opaque objectsOptics Communications, 1969
- Hologram Schlieren and Phase-Contrast MethodsJapanese Journal of Applied Physics, 1969
- Holographic Generation of Contour Map of Diffusely Reflecting Surface by Using Immersion MethodJapanese Journal of Applied Physics, 1968
- Surface Topography of Non-optical Surfaces by Projected Interference FringesNature, 1967
- Multiple-Wavelength and Multiple-Source Holography Applied to Contour Generation*Journal of the Optical Society of America, 1967
- Isopachic patterns by the moiré methodExperimental Mechanics, 1964