A stigmatic, second-order, double-focusing mass spectrometer
- 1 January 1978
- journal article
- Published by Elsevier in International Journal of Mass Spectrometry and Ion Physics
- Vol. 26 (1) , 77-90
- https://doi.org/10.1016/0020-7381(78)80006-0
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- The influence of a toroidal electric fringing field on the trajectories of charged particles in a third order approximationPublished by Elsevier ,2002
- The influence of an inhomogeneous magnetic fringing field on the trajectories of charged particles in a third order approximationPublished by Elsevier ,2002
- Third order transfer matrices of the fringing field of an inhomogeneous magnetPublished by Elsevier ,2002
- Double focusing mass spectrometers of second orderInternational Journal of Mass Spectrometry and Ion Physics, 1974
- The electrostatic potential in a toroidal condenserNuclear Instruments and Methods, 1972
- Influence of fringing fields on image aberrations of double-focusing mass spectrometersInternational Journal of Mass Spectrometry and Ion Physics, 1971
- A High Resolution Mass Spectrometer for Atomic Mass DeterminationsReview of Scientific Instruments, 1971
- MASS SPECTROMETERS AND MASS SPECTROGRAPHS CORRECTED FOR IMAGE DEFECTSPublished by Elsevier ,1959
- Massenspektrometer mit Doppelfokussierung zweiter OrdnungZeitschrift für Naturforschung A, 1957
- Angular Aberrations in Sector Shaped Electromagnetic Lenses for Focusing Beams of Charged ParticlesPhysical Review B, 1953