A novel technique for measuring reflectivities in the near infrared
- 1 April 1970
- journal article
- Published by Elsevier in Optics Communications
- Vol. 1 (9) , 460-462
- https://doi.org/10.1016/0030-4018(70)90179-3
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Lattice absorption bands observed in silicon by means of spectral emissivity measurementsJournal of Physics and Chemistry of Solids, 1962
- Infrared Lattice Absorption of GaPPhysical Review B, 1960