FIELD ION MICROSCOPE AND ATOM-PROBE STUDIES OF SCANNING TUNNELING MICROSCOPE TIPS

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Abstract
Tungsten and platinum-iridium alloy tips were observed by field emission and ion microscopes and were atom-probe mass analyzed to examine the tip surfaces corroded by exposure to air and by immersion into aqueous solutions. Although the A-P analysis indicates that the corroded layer is less than monoatomic thick for both W and Pt-Ir, the FEM and FIM observation indicates that exposure to air and immersion into solutions often result in the formation of a small protrusion at the tip apex. The observed sharp protrusion is highly desirable for a scanning tip of the scanning tunneling microscope and found to be more pronounced for Pt-Ir than W

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