Recording transmitted beam current for X‐ray microanalysis in a scanning transmission electron microscope

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1 November 1980

journal article
research article
Published by Wiley in Journal of Microscopy

Vol. 120 (2) , 207-211
https://doi.org/10.1111/j.1365-2818.1980.tb04137.x

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Quantitative electron probe microanalysis of biological thin sections: the use of stem for measurement of local mass thickness
Ultramicroscopy, 1978