Thickness dependence of the static dielectric constant of some built-up Langmuir films
- 16 November 1976
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 38 (1) , K77-K80
- https://doi.org/10.1002/pssa.2210380166
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
- Studies of dielectric constant of some “built-up” molecular filmsThin Solid Films, 1972
- Langmuir-Blodgett Multi-monolayers as Thin Film DielectricsNature, 1967
- Interferometric and x-ray diffraction study of “built-up” molecular films of some long chain compoundsSolid State Communications, 1966
- Electrical and Structural Properties of Langmuir FilmsJournal of the Electrochemical Society, 1966
- On the Vacuum-Ultraviolet Reflectance of Evaporated Aluminum before and during Oxidation*Journal of the Optical Society of America, 1963
- Tunneling Through Thin Insulating LayersJournal of Applied Physics, 1961
- Electrical Properties of Multimolecular FilmsJournal of the American Chemical Society, 1939
- Further Studies on the Electrical Properties of Stearate Films Deposited on MetalJournal of the American Chemical Society, 1938
- Built-Up Films of Barium Stearate and Their Optical PropertiesPhysical Review B, 1937
- Films Built by Depositing Successive Monomolecular Layers on a Solid SurfaceJournal of the American Chemical Society, 1935