X-Ray Microbeam Measurement of Local Texture and Strain in Metals
- 1 January 1999
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Strain and Texture in Al-Interconnect Wires Weasured by X-Xay Microbeam DiffractionMRS Proceedings, 1999
- Electromigration-induced stress in aluminum conductor lines measured by x-ray microdiffractionApplied Physics Letters, 1998
- Monochromators for small cross-section x-ray beams from high heat flux synchrotron sourcesPublished by SPIE-Intl Soc Optical Eng ,1996
- Microtexture determination by electron back-scatter diffractionJournal of Materials Science, 1992
- Residual StressPublished by Springer Nature ,1987
- On Texture Formation in Metallic FilmsPhysica Status Solidi (a), 1985
- High Rate Thick Film GrowthAnnual Review of Materials Science, 1977
- Structure/property/process relationships in chemical vapor deposition CVDJournal of Vacuum Science and Technology, 1974
- Angle calculations for 3- and 4-circle X-ray and neutron diffractometersActa Crystallographica, 1967