Low thermal power electron beam annealing of scanning tunneling microscope tips
- 1 August 1997
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 68 (8) , 3262-3263
- https://doi.org/10.1063/1.1148279
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Cross-sectional scanning tunnelling microscopy of III-V semiconductor structuresSemiconductor Science and Technology, 1994
- Direct imaging of dopants in GaAs with cross-sectional scanning tunneling microscopyApplied Physics Letters, 1993
- Observation of point defects and microfaceting on GaAs(110) surfaces by scanning tunneling microscopyVacuum, 1990