Factors Affecting Image Quality for Megavoltage and Diagnostic X-Ray a-Si:H Imaging Arrays.

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Abstract
Two factors which could affect the image quality of the a-Si:H arrays under development by our collaboration are the temporal drift of the leakage current of the sensors and the capture and release of charge in deep trapping states in the sensors. Data for both of these factors are reported, the implications for imaging are discussed, and strategies for reducing or eliminating their effects are suggested.