Effective collision strengths for Si III

Abstract
Collision strengths are presented for electron impact excitation among the 12 lowest LS states (corresponding to 20 levels including the splitting of the triplet terms) of Si III calculated using the R-matrix method. These collision strengths are used to deduce effective collision strengths, adopting a Maxwellian electron energy distribution. Polynomial fits of the effective collision strength are tabulated for all transitions between the fine structure levels for electron temperatures (Te) between log Te = 3.8 and 5.2. For selected transitions, information on the collision strength near threshold is also tabulated. This should be sufficient to estimate the effect of deviations from the Maxwellian electron energy distribution, such as may occur in the solar transition region.

This publication has 0 references indexed in Scilit: