EFFECTS OF INELASTICALLY SCATTERED ELECTRONS IN VARIOUS CTEM AND STEM IMAGING MODES
- 1 March 1978
- journal article
- Published by Wiley in Annals of the New York Academy of Sciences
- Vol. 306 (1) , 47-61
- https://doi.org/10.1111/j.1749-6632.1978.tb25638.x
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Contribution of electron energy loss spectroscopy to the development of analytical electron microscopyUltramicroscopy, 1976
- Proton vs. electron scanning transmission microscopy: The ratio of elastic to inelastic cross-sectionsUltramicroscopy, 1976
- An energy filter for biological electron microscopyJournal of Microscopy, 1974
- Electron microscopy of plasmonsPhilosophical Magazine, 1974
- Image Formation in the Electron Microscope with Particular Reference to the Defects in Electron-Optical ImagesPublished by Elsevier ,1973
- Interaction of 25 keV Electrons with the Nucleic Acid Bases, Adenine, Thymine, and Uracil. II. Inner Shell Excitation and Inelastic Scattering Cross SectionsThe Journal of Chemical Physics, 1972
- A High-Resolution Scanning Transmission Electron MicroscopeJournal of Applied Physics, 1968
- The Theoretical Resolution Limit of the Electron MicroscopeJournal of Applied Physics, 1949
- Applications of the method of impact parameter in collisionsProceedings of the Royal Society of London. Series A, Containing Papers of a Mathematical and Physical Character, 1933