Statistical distribution of neutron semiconductor device degradation
- 1 October 1974
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 21 (5) , 23-27
- https://doi.org/10.1109/TNS.1974.6499271
Abstract
The population of permanent neutron degradation of base current per unit neutron fluence is normally distributed. The standard deviation of the population is about 10% of the mean degradation. This information is used to estimate circuit failures after a neutron pulse.Keywords
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