High Resolution Electron Microscopy of an Alumina/Copper Interface
- 1 January 1988
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Characterization of Ag/CdO interfacesPhilosophical Magazine Letters, 1988
- T.E.M. study of Al2O3metastable phasesRadiation Effects, 1983
- Direct electron microscopy of thin foils of internally oxidized dilute copper alloysPhilosophical Magazine, 1960