Model for the resistance variation of a thin semiconducting film during temperature- programmed desorption: Application to the O2-CdSe system
- 1 September 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 131 (1-2) , 51-68
- https://doi.org/10.1016/0040-6090(85)90374-8
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Thermal desorption of gasesPublished by Elsevier ,2002
- Regeneration of CdSe thin films after oxygen chemisorptionThin Solid Films, 1984
- Resistance variation of a semiconduction thin film during a thermal desorptionPhysica Status Solidi (a), 1981
- The chemisorption forms and the centre nature of oxygen chemisorption on the CdSe thin-film surfacesIl Nuovo Cimento B (1971-1996), 1981
- Simple ways to improve ’’flash desorption’’ measurements from single crystal surfacesJournal of Vacuum Science and Technology, 1980
- Surface electronic and chemical structure ofSurface Science, 1977
- An accurate and versatile vibrating capacitor for surface and adsorption studiesJournal of Physics E: Scientific Instruments, 1977
- Surface photovoltage and electron energy‐loss spectroscopy of oxygen adsorbed on (112̄0) CdSeJournal of Vacuum Science and Technology, 1976
- Thermal resolution of desorption energy spectraVacuum, 1962