Measurement of differential gain and linewidth enhancementfactor ofInGaAs vertical cavity surface emitting laser
- 30 March 1995
- journal article
- Published by Institution of Engineering and Technology (IET) in Electronics Letters
- Vol. 31 (7) , 557-559
- https://doi.org/10.1049/el:19950371
Abstract
The differential gain of an InGaAs/GaAs vertical cavity surface emitting laser (VCSEL) has been obtained through measurement of the subthreshold spectral linewidth. The results are in close agreement with a theoretical model for a VCSEL operating at the peak of the gain spectrum. The linewidth enhancement factor has been measured to be ~0.7 at low bias currents again in agreement with theory.Keywords
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