Two-Dimensional X-ray Photoelectron Spectroscopy for Composite Surface Analysis
- 16 April 2008
- journal article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 80 (10) , 3931-3936
- https://doi.org/10.1021/ac702642w
Abstract
We describe a method for obtaining two-dimensional X-ray photoelectron spectroscopic data derived from the frequency dependence of the XPS peaks recorded under electrical square-wave pulses, which control and affect the binding energy positions via the electrical potentials developed as a result of charging. By using cross-correlations between various peaks, our technique enables us to elucidate electrical characteristics of surface structures of composite samples and bring out various correlations between hidden/overlapping peaks.Keywords
This publication has 47 references indexed in Scilit:
- Surface Enrichment and Depletion Effects of Ions Dissolved in an Ionic Liquid: An X‐ray Photoelectron Spectroscopy StudyAngewandte Chemie International Edition in English, 2006
- Onset of Catalytic Activity of Gold Clusters on Titania with the Appearance of Nonmetallic PropertiesScience, 1998
- Multi-Atom Resonant Photoemission: A Method for Determining Near-Neighbor Atomic Identities and BondingScience, 1998
- Molecular Recognition by Self-Assembled Monolayers of Cavitand ReceptorsScience, 1994
- Biodegradable Long-Circulating Polymeric NanospheresScience, 1994
- Van der Waals Epitaxial Growth of α-Alumina Nanocrystals on MicaScience, 1993
- Correlation Between Surface Free Energy and Surface ConstitutionScience, 1992
- Electron Spectroscopy for Atoms, Molecules, and Condensed MatterScience, 1982
- Surface Spectroscopies with Synchrotron RadiationScience, 1982
- Electron Spectroscopy with Monochromatized X-raysScience, 1972