Donorlike excited states of the thermally induced 0.767-eV (line) defect in oxygen-rich silicon
- 15 April 1985
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 31 (8) , 5561-5564
- https://doi.org/10.1103/physrevb.31.5561
Abstract
Photoluminescence-excitation spectroscopy with a KCl: Tl color-center laser is performed on the thermally induced defect in oxygen-rich silicon which emits the 0.767-eV () no-phonon line. We find two sets of excited states. One set 20-30 meV above the transition is identified with effective-mass-like electron states of a pseudodonor. The ionization energy of the pseudodonor electron is 34.3 meV and the binding energy of the strongly localized hole amounts to 368.2 meV. The other set ≃ 65 meV above the transition is due to anti-Stokes local modes of the excited defect, and one further line possibly originates from an excited state of the deeply bound hole.
Keywords
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