Spatially resolved measurements of highly conductive and highly resistive grain boundaries using microcontact impedance spectroscopy
- 2 November 2000
- journal article
- Published by Elsevier in Solid State Ionics
- Vol. 136-137 (1-2) , 905-911
- https://doi.org/10.1016/s0167-2738(00)00522-1
Abstract
No abstract availableKeywords
This publication has 0 references indexed in Scilit: