Investigation of Porous Silicon Films Structure by Optical Methods
- 1 January 1992
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- Optical properties of porous silicon: A first-principles studyPhysical Review Letters, 1992
- Silicon optoelectronics at the end of the rainbow?Physics World, 1992
- Visible electroluminescence from porous siliconApplied Physics Letters, 1992
- Visible luminescence from porous silicon and siloxenePhysica Scripta, 1992
- An infrared study of thin-film formation on Si and Ge surfaces treated with aqueous NH4F and HFJournal of Applied Physics, 1991