A rapid method for determining compositional phases in electron diffraction patterns using computer simulation
- 1 January 1980
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 5 (1-3) , 275-280
- https://doi.org/10.1016/0304-3991(80)90032-7
Abstract
No abstract availableKeywords
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- Relativistic Hartree–Fock X-ray and electron scattering factorsActa Crystallographica Section A, 1968
- The analytical representation of atomic scattering amplitudes for electronsActa Crystallographica, 1962