FTIR spectroscopy and AES study of water containment in SiO2 thin films
- 1 August 1996
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 281-282, 409-411
- https://doi.org/10.1016/0040-6090(96)08690-7
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- Structural and optical characterization of CuO particulate solid films and the corresponding gels and xerogelsJournal of Non-Crystalline Solids, 1993
- Optical properties of TiO2, Y2O3 and CeO2 thin films deposited by electron beam evaporationThin Solid Films, 1993
- Modern Optical Coating TechnologiesPublished by SPIE-Intl Soc Optical Eng ,1989