Transition from Planar to Bulk Properties in Multi-Layer System
- 1 November 1997
- journal article
- research article
- Published by Taylor & Francis in Electromagnetics
- Vol. 17 (6) , 563-571
- https://doi.org/10.1080/02726349708908562
Abstract
The properties of mutilayer system are studied experimentally and by computer simulation. It has been shown that in spite of strong interaction between the layers of planar percolation system there exists a microscopic length d that determines transition from thin to bulk system. The value of d is determined by mean distance between clusters, being independent of the cluster size.Keywords
This publication has 9 references indexed in Scilit:
- Theory of the optical and microwave properties of metal-dielectric filmsPhysical Review B, 1995
- The permittivity of a planar percolation systemJournal of Physics: Condensed Matter, 1994
- The effective permeability of granular thin filmsIEEE Transactions on Magnetics, 1993
- Transmittance and reflectance i n s i t u measurements of semicontinuous gold films during depositionJournal of Applied Physics, 1989
- The geometry of the percolation thresholdAIP Conference Proceedings, 1978
- The cathode spot of a vacuum arcUspekhi Fizicheskih Nauk, 1978
- Critical Behaviour of Conductivity and Dielectric Constant near the Metal‐Non‐Metal Transition ThresholdPhysica Status Solidi (b), 1976
- Reflection of light by a semi-infinite dielectricThe Journal of Chemical Physics, 1974
- Polaritons at SurfacesPhysical Review B, 1969