Temperature Dependence of Selective Reflection in Ferroelectric SmC* Liquid Crystal

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Abstract
The temperature dependences of the selective reflection in a ferroelectric SmC* liquid crystal (CS-1017) are measured accurately in homeotropically aligned cells for different cell thicknesses. For over-50 µm cell thickness, those are in good agreement. Especially for 205 µm cell thickness, the wavelength of the selective reflection decreases with temperature near the SmC*-SmA transition point. The results obtained are also compared with the temperature dependences of the helical pitch determined by the laser diffraction method in homogeneously aligned cells.