An introduction to fault tree analysis with emphasis on failure rate evaluation
- 1 April 1975
- journal article
- Published by Elsevier in Microelectronics Reliability
- Vol. 14 (2) , 105-119
- https://doi.org/10.1016/0026-2714(75)90024-4
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Fault Tree Analysis with Probability EvaluaticnIEEE Transactions on Nuclear Science, 1971
- A time-dependent methodology for fault tree evaluationNuclear Engineering and Design, 1970