Sims-untersuchungen zur volumendiffusion von Al in Ge
- 31 May 1982
- journal article
- Published by Elsevier in Acta Metallurgica
- Vol. 30 (5) , 941-946
- https://doi.org/10.1016/0001-6160(82)90200-0
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Impurity diffusion of Al in Ni single crystals studied by secondary ion mass spectrometry (SIMS)Physica Status Solidi (a), 1981
- Sims investigations on the diffusion of Cu in Ag single crystalsActa Metallurgica, 1980
- Isotope effect in the diffusion of the stable germanium isotopes in copperActa Metallurgica, 1979
- A comparison between microsectioning studies of low-temperature self-diffusion in silverPhysica Status Solidi (a), 1978
- Etude de l'effet isotopique pour la diffusion du nickel dans le cuivre par spectrometrie de masse a emission ionique secondaireActa Metallurgica, 1976
- Progress in analytic methods for the ion microprobe mass analyzerInternational Journal of Mass Spectrometry and Ion Physics, 1969
- Massenspektrometrische Untersuchung der Sekundärionen-Emission von LegierungenZeitschrift für Naturforschung A, 1968
- Untersuchungen zur Emission positiver Sekundärionen aus festen Targets. Die Brauchbarkeit der Ionenbeschuß-Ionenquelle in der MassenspektroskopieZeitschrift für Naturforschung A, 1967