Planar Defect in A15 Structure Observed in Cr–Si Fine Particles
- 1 July 1983
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 22 (7R)
- https://doi.org/10.1143/jjap.22.1092
Abstract
A new planar defect in the A15 structure was found in fine particles formed by the evaporation of Cr–Si alloy in Xe gas. Electron microscopic analysis showed that the planar defect lies on the {100} plane and the displacement vector due to the defect is <±1/8, 1/2, 0>a. A probable model of the defect is proposed.Keywords
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