Finite-frequency shot noise in a correlated tunneling current

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Abstract
An analytical expression for shot noise in a correlated sequential tunneling current has been derived by solving the master equation exactly, with the Pauli correlation as a special case. Our theory is applied to the Coulomb-blockade single-electron tunneling system with two tunnel junctions. Given capacitances and resistances of the system, the temperature dependence and the bias-voltage dependence of the noise spectrum in the entire range of frequency have been analyzed in detail. We have demonstrated that the noise spectrum is more sensitive to the bias voltage than is the current itself to the voltage. Therefore, noise spectroscopy is a much more accurate tool to investigate the correlation in tunneling transport through ever smaller multiple-junction structures.