Dependence of Off-Diagonal Components of χ(3) on Substrate Temperature of Epitaxially Grown Vanadyl Phthalocyanine Films

Abstract
Single-crystalline vanadyl phthalocyanine films have been grown by the molecular beam epitaxy technique. The normalized off-diagonal ratio 3χ12211111 has been determined by circular-polarization third-harmonic generation measurement. It is revealed that the single-crystalline phase with 4mm symmetry can be distinguished from the C ∞υ polycrystalline phase by circular-polarization third-harmonic generation measurement, and the quality of the epitaxial film can be quantitatively analyzed by the normalized off-diagonal ratio of 3χ12211111.