Comment on ‘‘Defects in amorphous silicon: A new perspective’’
- 29 June 1987
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 58 (26) , 2824
- https://doi.org/10.1103/physrevlett.58.2824
Abstract
A Comment on the Letter by Pantelides, Phys. Rev. Lett. 57, 2979 (1986).Keywords
This publication has 6 references indexed in Scilit:
- Bragg diffraction by amorphous siliconNature, 1987
- Defects in Amorphous Silicon: A New PerspectivePhysical Review Letters, 1986
- Effect of silane dilution on intrinsic stress in glow discharge hydrogenated amorphous silicon filmsJournal of Applied Physics, 1984
- Broken chemical order and phase separation in GexSe1−x glassesSolid State Communications, 1983
- Theory of static structural properties, crystal stability, and phase transformations: Application to Si and GePhysical Review B, 1982
- A thermodynamic criterion of the crystalline-to-amorphous transition in siliconPhilosophical Magazine Part B, 1982