Impact of Casimir-Polder Potential and Johnson Noise on Bose-Einstein Condensate Stability near Surfaces

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  • 22 August 2003
Abstract
We investigate the stability of magnetically trapped atomic Bose-Einstein condensates at small distances 0.5 microns < d < 10 microns from a microfabricated silicon chip. For a 2 microns thick copper film the trap lifetime is limited by Johnson-noise induced currents and falls below 1 s at a distance of 4 microns. A dielectric surface does not adversely affect the sample until the attractive Casimir-Polder potential significantly reduces the trap depth.

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