Calculational demonstration that averaging enhances data for use in a LEED analysis
- 2 February 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 115 (1) , L75-L80
- https://doi.org/10.1016/0039-6028(82)90654-9
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- 1979 LEED analysis of Cu(100)Journal of Vacuum Science and Technology, 1980
- A reliability factor for surface structure determinations by low-energy electron diffractionSurface Science, 1977
- Low-Energy-Electron-Diffraction Spectra from [001] Surfaces of Face-Centered Cubic Metals: Theory and ExperimentPhysical Review B, 1972